Ellen Voorhees, National Institute of Standards and Technology, US (chair)
Krisztian Balog, University of Amsterdam, The Netherlands
Nicholas J. Belkin, Rutgers University, USA
Martin Braschler, Zurich University of Applied Science, Switzerland
Soumen Chakrabarti, Indian Institute of Technology, Bombay, India
Gareth Jones, Dublin City University, Ireland
David D. Lewis, David D. Lewis Consulting, USA
Ian Ruthven, University of Strathclyde, United Kingdom
Tetsuya Sakai, Microsoft Research Asia, China
